首页> 外国专利> AN APPARATUS FOR MEASURING OPTIC AXIS OFF-ALIGNMENT OF POLARIZING PLATE AND PHASE RETARDATION PLATE AND METHOD THEREOF

AN APPARATUS FOR MEASURING OPTIC AXIS OFF-ALIGNMENT OF POLARIZING PLATE AND PHASE RETARDATION PLATE AND METHOD THEREOF

机译:偏光板和相位延迟板的光轴偏斜测量装置及其方法

摘要

PPROBLEM TO BE SOLVED: To provide a method for measuring an optical axis alignment error with high accuracy in a sample comprising a polarizing plate and a phase retardation plate joined together. PSOLUTION: The method includes steps of: adjusting the phase retardation angle of a compensator placed in the rear end of the sample according to a preliminarily determined value; measuring luminosity while rotating a polarizer placed between the light source and the sample; calculating the azimuth of the polarizer at the maximum luminosity; rotating the compensator around the azimuth of the phase retardation plate by every predetermined angle while the polarizer is fixed; measuring the luminosity at each azimuth of the compensator by rotating an analyzer placed in the rear end of the compensator; calculating the azimuth of the analyzer at the maximum luminosity; and calculating the optical axial alignment error between the polarizer and the phase retardation plate from the azimuth of the polarizer and the azimuth of the analyzer. PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种用于高精度地测量包括接合在一起的偏振板和相位延迟板的样品中的光轴对准误差的方法。解决方案:该方法包括以下步骤:根据预先确定的值调节放置在样品后端的补偿器的相位延迟角;旋转放置在光源和样品之间的偏振器,同时测量光度;计算偏振器在最大光度下的方位角;在偏振器固定的同时,使补偿器绕相位延迟板的方位旋转每个预定角度。通过旋转位于补偿器后端的分析仪来测量补偿器每个方位角的光度;计算分析仪在最大光度下的方位角;根据偏振片的方位角和检偏器的方位角计算出偏振片与相位延迟片之间的光轴对准误差。

版权:(C)2006,JPO&NCIPI

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