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SYSTEM FOR MEASURING AND CONTROLLING PRESS LOAD OF PROVE HEAD

机译:测压头压力负荷测控系统

摘要

The present invention is easily adjust the pressing force of the measurement head in a system for measuring the surface resistivity of the sample or relates to a measurement system that can be measured with the structure of pressing load. The structure of the measurement system in the case of existing systems can be divided into The fixture of the measuring head attached to the operation portion and the induction of operating up and down by a support structure fixed to the structure supporting the measuring head is guided retainer for fixing the measuring head The total weight of the structure and the measuring head has a structure that is operated by pressing force at the time of measurement. ; surface using a four-probe or two-probe resistance measurement system is widely used in the silicon wafer and the like elsidi panel surface resistance of various films and metals. This is a probe (tip) principle to measure the surface resistance of the sample using an electrical method in a state where the pressing surface of the measurement sample of the measurement head. However, this method is 10 / sq or more high-resistance material or thickness to be measured when the surface resistance of the thin film probe of the measuring head in the contact resistance occurs when the contact with the surface of the test sample which are closely related to the pressing load Existing methods are difficult to measure accurately. ; This invention is installed on the other side of the weight, such that the pulley to the fixed support so as to measure the pressing load easily adjusted according to the measurement of such a measurement head to the sample to achieve equilibrium with the total weight of the measuring head a structure connecting the main features of the weight. In other words, the total weight of the measuring head is fixed to the structure because the equilibrium surface when related to the sample when measuring the resistance put by selecting the weight of the weight measured on the measuring head. And, another way is to attach the sensor to measure the load on the fixed structure for connection with a measuring head for measuring relates to measuring systems for adjusting the load of the measuring head during measurement.
机译:本发明容易在用于测量样品的表面电阻率的系统中调节测量头的按压力,或者涉及一种可以利用按压力的结构进行测量的测量系统。在现有系统的情况下,测量系统的结构可分为安装在操作部分上的测量头的固定装置和通过固定在支撑测量头的结构上的支撑结构引导上下操作的导向保持器。用于固定测量头的结构和测量头的总重量具有在测量时通过按压力操作的结构。 ;使用四探针或两探针电阻测量系统的表面被广泛用于硅晶片等类似硅片面板的各种膜和金属的表面电阻。这是一种探针(尖端)原理,用于在测量头的测量样品的按压表面处于一定状态的情况下,通过电气方法测量样品的表面电阻。但是,该方法是当测量头的薄膜探针的表面电阻在与被测样品的表面紧密接触时产生的接触电阻中的10 / sq或更高的高电阻材料或厚度。与压力负荷有关的现有方法难以准确测量。 ;本发明安装在重物的另一侧,以使滑轮固定到固定支撑件上,以便容易地根据这种测量头的测量来调节对试样的压力负荷,以达到与试样总重量的平衡。测量头一种连接砝码主要特征的结构。换句话说,由于通过选择在测量头上测量的重量的重量来测量电阻时的平衡表面与样品相关时,测量头的总重量固定在结构上。并且,另一种方式是在固定结构上附接传感器以测量负荷,以与用于测量的测量头连接,该测量系统涉及用于在测量期间调整测量头的负荷的测量系统。

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