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METHOD AND APPLICATION OF PICA(PICOSECOND IMAGING CIRCUIT ANALYSIS) FOR HIGH CURRENT PULSED PHENOMENA
METHOD AND APPLICATION OF PICA(PICOSECOND IMAGING CIRCUIT ANALYSIS) FOR HIGH CURRENT PULSED PHENOMENA
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机译:用于大电流脉冲现象的PICA(精确成像电路分析)方法和应用
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摘要
A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. Signals from the photosensor are used to map photon emissions from the DUT. Data processing means relate the photon emissions to specific features of the DUT.
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