HALF-METAL CRO2 COATED ATOMIC FORCE MICROSCOPE TIP

摘要

the present invention is the use of an atomic force microscope probe that supplies the functionality to have to increase the strength of the coating for the relates. ; and the hardness of the diamond like the prior art, in order to increase the strength of the probe using a coating material of high, for measuring conductivity of gold, with a lot of the coating of metal such as platinum, and magnetic measurements uses a coating of magnetic material such as ferrite for. However, this technology is not able to, but at the same time the atomic force microscope, magnetic force microscope at the same time increasing the strength of the probe (magnetic force microscope) and conductive atomic force microscope (conducting atomic force micoscope), the present invention provides for the coating of semi-metal probe (half -metal) CrO ₂ , because the use of probes that can simultaneously increase the strength of an atomic force microscope, magnetic force microscopy (magnetic force microscope), conductive atomic force microscopy (conducting atomic force micoscope) to probe the offer available to . In addition, the prior art atom by AFM microscopy, magnetic force microscopy (magnetic force microscope), conductive AFM (conducting atomic force micoscope) but replace the probe according to the application during the measurement, in the present invention metal half (half-metal) CrO ₂ the coated AFM probe, magnetic force microscopy (magnetic force microscope), conductive atomic force microscopy (conducting atomic force micoscope) measurements can be used in both, and the hardness is superior to the probe due to the long life of a boy, so in the use of the atomic force microscope probe of the economics of supply is provided.