首页> 外国专利> A method for determining the coupling capacitance electrically non-conductive analytical samples in the case of the elemental analysis by means of gd - oes or gd - ms

A method for determining the coupling capacitance electrically non-conductive analytical samples in the case of the elemental analysis by means of gd - oes or gd - ms

机译:通过gd-oes或gd-ms进行元素分析时确定耦合电容非导电分析样品的方法

摘要

A method for determining the coupling capacitance electrically non-conductive analytical samples in a glow discharge source for elemental analysis by means of optical smoulder discharge spectroscopy (gd - oes) with an ac voltage generator, and means for measuring the system capacity is, characterized by the following process steps:a) measuring the system capacity is c0 at a plurality of different reference samples r with a known relative dielectric constant εr and a defined thickness d at the glow discharge source for elemental analysis to be used in the working state without glow discharge (blank),b) measuring the system capacity is c0 on the sample to be analyzed p at the glow discharge source for elemental analysis to be used in the working state without glow discharge (blank),c) calculating the coupling capacitor cpp the sample to be analysed p from the measured values c0 of the reference samples r and the measured value c0 the sample p with the inclusion of the known εr – and thickness values d of the reference samples r.
机译:一种用于测定辉光放电源中耦合电容的非导电分析样品的方法,该方法用于通过带有交流电压发生器的闷烧放电光谱法(gd-oes)进行元素分析,以及用于测量系统容量的方法,其特征在于以下过程步骤:a)在多个不同的参考样品r上以已知的相对介电常数ε r 和定义的厚度d测量系统容量为c 0 用于元素分析的辉光放电源在工作状态下不使用辉光放电(空白),b)测量待分析样品的系统容量为c 0 ,在辉光放电源处p在没有辉光放电的工作状态下进行元素分析(空白),c)从测量值c 0 计算耦合电容器c pp 参考样品r和测量值c 0 样本p,其中包含已知的ε r –参考样本r的厚度值d。

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