首页> 外国专利> Apparatus and method for the combined interferometric and imaging geometry recognition based, in particular, in microsystem technology

Apparatus and method for the combined interferometric and imaging geometry recognition based, in particular, in microsystem technology

机译:尤其基于微系统技术的用于组合干涉测量和成像几何形状识别的装置和方法

摘要

Apparatus and method for the combined planar detecting height values of an object by means of interferometry (interferometric measuring mode) and for measuring the lateral dimensions of geometric elements by means of recording and a digital evaluation of optical images of the object of measurement (image processing mode), characterized in that a lens is used, which in one part of the spectrum of electromagnetic waves and acts as interference objective of a different portion of the spectrum of a pure optical imaging of the object of measurement, so that by varying the spectral composition of the light used for the incident light - illumination from the interferometric measuring mode in the image processing mode can be changed.
机译:用于通过干涉测量法(干涉测量模式)组合地检测物体的高度值并通过记录和数字评估被测量物体的光学图像(图像处理)来测量几何元素的横向尺寸的装置和方法模式),其特征在于,使用透镜,该透镜在电磁波光谱的一部分中用作测量对象的纯光学成像光谱的不同部分的干涉物镜,从而通过改变光谱用于入射光的光的成分-可以更改图像处理模式中干涉测量模式的照明。

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