Structure-detection method for determining the inner structure of non-metal objects detects electric/magnetic measurement data via a measuring unit

摘要

In detecting electric/magnetic measurement data for a non-metallic object, two measuring units (MU) use microwave applicators (11-13,14-16) graded regarding their field geometry/radiating characteristics and regarding their in-depth action. The MU differ regarding weighting of deep-layer electric/magnetic properties so as to yield in-depth information for more than two-dimensional layouts.