首页> 外国专利> Laser light homogenization arrangement for use in mask inspection system in semiconductor manufacture, has diffraction grating arranged before first lens array for producing continuous spectrum of laser light

Laser light homogenization arrangement for use in mask inspection system in semiconductor manufacture, has diffraction grating arranged before first lens array for producing continuous spectrum of laser light

机译:用于半导体制造中的掩模检查系统的激光均质化装置,在第一透镜阵列之前布置有衍射光栅,以产生连续光谱的激光

摘要

The arrangement includes two parallel lens arrays (2,3). A diffraction grating (7) is arranged before the first lens array (2) for bending the wavelength coverage of a laser source in the focusing direction of the first lens array to produce an expanded continuous spectrum of laser light. Another diffraction grating (8) is arranged before the other diffraction grating (7) for expanding the laser light in a dispersion direction perpendicular to the diffraction grating (7).
机译:该装置包括两个平行的透镜阵列(2,3)。在第一透镜阵列(2)之前布置有衍射光栅(7),用于在第一透镜阵列的聚焦方向上弯曲激光源的波长范围,以产生扩展的连续光谱的激光。另一个衍射光栅(8)布置在另一个衍射光栅(7)之前,用于在垂直于衍射光栅(7)的色散方向上扩展激光。

著录项

  • 公开/公告号DE102005012012A1

    专利类型

  • 公开/公告日2006-09-28

    原文格式PDF

  • 申请/专利权人 CARL ZEISS JENA GMBH;CARL ZEISS SMS GMBH;

    申请/专利号DE20051012012

  • 发明设计人 DOBSCHAL HANS-JUERGEN;

    申请日2005-03-16

  • 分类号G02B27/09;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:21

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