首页> 外国专利> Position measuring device, has part carrier including surface lying in proximity of focal plane of lens arrangement, such that image of impurities or residual particle on carrier surface, is delocalized over sensitive surface of detector

Position measuring device, has part carrier including surface lying in proximity of focal plane of lens arrangement, such that image of impurities or residual particle on carrier surface, is delocalized over sensitive surface of detector

机译:位置测量装置,具有部分载体,该部分载体包括位于透镜装置的焦平面附近的表面,从而使载体表面上的杂质或残留颗粒的图像在探测器的敏感表面上散开。

摘要

The device has a scanning unit scanning a material measure for determining position information. A part carrier (1) includes a surface (12) lying between the measure and a radiation sensitive surface (35) of a detector in the scanning unit. The carrier surface lies in the proximity of a focal plane of the arrangement, such that an image of impurities or residual particle on the carrier surface, is delocalized over the detector surface.
机译:该设备具有扫描单元,该扫描单元扫描用于确定位置信息的材料量度。零件载体(1)包括位于量具和扫描单元中的检测器的辐射敏感表面(35)之间的表面(12)。载体表面位于该装置的焦平面附近,使得载体表面上的杂质或残留颗粒的图像在检测器表面上离域。

著录项

  • 公开/公告号DE102005013222A1

    专利类型

  • 公开/公告日2006-09-21

    原文格式PDF

  • 申请/专利权人 DR. JOHANNES HEIDENHAIN GMBH;

    申请/专利号DE20051013222

  • 发明设计人 BENNER ULRICH;

    申请日2005-03-17

  • 分类号G01B11/00;G01B11/26;G01D5/36;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:21

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