Semiconductor unit e.g. integrated electrical circuit, testing device, has adding blocks, where sine and cosine values lie for current time to sine and cosine inputs, and number of periods and increment are adjusted by input signals

摘要

The device has a functional generator with two adding blocks (2, 3) having sine and cosine inputs and outputs and are formed in such a manner that the blocks measure cosine and sine values for specified times. The sine value lies for current time to the sine inputs and the cosine value lies for the current time to the cosine inputs, whereby the number of periods and an increment are adjusted by input signals of the generator. Independent claims are also included for the following: (1) an electrical circuit for generating a sinusoidal signal (2) a method for testing a semiconductor unit.