首页> 外国专利> Image sensor for collecting incident light, converting to electrical charges for image processing has floating diffusion region or region of charge-coupled component with buried channel in substrate and that contacts second channel region

Image sensor for collecting incident light, converting to electrical charges for image processing has floating diffusion region or region of charge-coupled component with buried channel in substrate and that contacts second channel region

机译:用于收集入射光并将其转换为电荷以进行图像处理的图像传感器具有浮动扩散区域或电荷耦合组件的区域,该区域的潜孔位于基板中并且与第二通道区域接触

摘要

The image sensor has a substrate (100) of a first conductivity type, a photodiode region (142) of a second conductivity type, a component region with accumulated holes on a surface of the substrate and above the photodiode region, a transfer gate electrode (132), first and second channel regions (112,114) of the first and second conductivity types and a floating diffusion region (152) or a region of a charge-coupled component with buried channel in the substrate and that electrically contacts the second channel region. An independent claim is also included for a method of manufacturing an inventive device.
机译:该图像传感器具有第一导电类型的基板(100),第二导电类型的光电二极管区域(142),在基板表面上且在光电二极管区域上方具有积聚空穴的组成区域,转移栅电极( 132),第一和第二导电类型的第一和第二沟道区域(112,114)以及浮置扩散区域(152)或电荷耦合组件的区域,其在衬底中具有掩埋沟道并且与第二沟道区域电接触。还包括用于制造本发明装置的方法的独立权利要求。

著录项

  • 公开/公告号DE102005026629A1

    专利类型

  • 公开/公告日2005-12-29

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20051026629

  • 发明设计人 SHIN JONG-CHEOL;

    申请日2005-06-03

  • 分类号H01L27/146;H04N5/335;H04N3/15;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:17

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