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Raman probe for measuring the Raman effect in solid bodies and during semiconductor crystal growth processes has coupling prisms, compound lenses and a narrow band pass filter arranged between the last two compound lenses
Raman probe for measuring the Raman effect in solid bodies and during semiconductor crystal growth processes has coupling prisms, compound lenses and a narrow band pass filter arranged between the last two compound lenses
Raman probe for measuring the Raman effect in solid bodies and during semiconductor crystal growth processes comprises a laser light source and measurement and evaluation units. Two prisms (2, 3) are provided to couple the laser light from a sample (4) into the measurement optical system. The measurement unit comprises four aberration correcting compound lenses (5, 7, 8, 10), three having a positive focal length and one a negative. Finally a narrow band pass filter (9) is mounted between the third and fourth compound lenses.
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