首页> 外国专利> Sensor, for scanning probe microscopy, has cylindrical shaped nano-structure formed on microstructure designed as substrate, by electron beam or ion beam, in additive and/or subtractive process and arranged perpendicular to base of pyramid

Sensor, for scanning probe microscopy, has cylindrical shaped nano-structure formed on microstructure designed as substrate, by electron beam or ion beam, in additive and/or subtractive process and arranged perpendicular to base of pyramid

机译:用于扫描探针显微镜的传感器具有圆柱形纳米结构,该纳米结构在加成和/或减成过程中通过电子束或离子束在设计为基材的微结构上形成,并垂直于金字塔底

摘要

The sensor has a cylindrical shaped nano-structure formed on a microstructure (15) designed as a substrate (1), by an electron beam or an ion beam, in an additive and/or subtractive process. The structure (15) is additively processed in a processing sequence by electron beam deposition or ion beam deposition or subtractively processed by a chemical or physical etching technique. The nano-structure is arranged perpendicular to a base of a pyramid.
机译:该传感器具有圆柱形的纳米结构,其通过加和/或减法通过电子束或离子束形成在设计为衬底(1)的微结构(15)上。结构(15)通过电子束沉积或离子束沉积按处理顺序被加成处理,或者通过化学或物理蚀刻技术相减地处理。纳米结构垂直于金字塔的底部排列。

著录项

  • 公开/公告号DE20321217U1

    专利类型

  • 公开/公告日2006-11-02

    原文格式PDF

  • 申请/专利权人 NANOTOOLS GMBH;

    申请/专利号DE2003221217U

  • 发明设计人

    申请日2003-05-16

  • 分类号B82B3;H01J37/30;

  • 国家 DE

  • 入库时间 2022-08-21 21:19:36

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