Suitable for this purpose a microarray, as well as production - and it is an object pin distance correction method

摘要

PROBLEM TO BE SOLVED: To obtain more accurate data through a microarray experiment by compensating errors in the amount of a pin-to-pin spot which occur when a microarray is manufactured using a plurality of pins.;SOLUTION: During manufacture of the microarray, a sample for use as control for correcting the errors in the amount of the pin-to-pin spot is fixed on microarray support by means of all the pins. After the microarray experiment, a cumulative value of emission strength thereof is measured. A parameter for correcting the error in the amount of the pin-to-pin spot, for each pin, is calculated from the cumulative value of the emission strength of the sample used as a control spot for correcting the error in the amount of the pin-to-pin spot for each pin, and is used for correcting the cumulative value of emission strength of other sample.;COPYRIGHT: (C)2001,JPO