Optical component to the observation of a sample nanometric, system comprising such a component, the method of analysis using this component, and their applications

摘要

The present invention relates to an optical component to the observation of a sample, comprising a substrate and at least one layer of complex index and thickness predetermined, intended to show a high contrast of the intensity or of color for the variations in optical path, the reliefs, the thicknesses and the diameters of nanometric when it is observed by reflection in incoherent light, convergent about the normal incidence in the conditions of the extinction of polarization, characterized in that the upper layer of index has surface properties specific giving it a selective affinity with respect to at least one characteristic of the échantillon.l' invention also relates to an analysis system comprising such a component, a method of analysis using this component and the applications of this method.