MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM.

摘要

The invention relates to a measurement system and method for the optical characterization of the visual appearance of a sample of material. The system includes an optical illumination device (2) of the sample and an optical device (10, 11, 12, 30) for forming a multi-angular optical signal of the light reflected by the sample. According to the invention, the optical training device comprises an optics for simultaneous formation of several images of the sample and a parabolic deflector placed facing the formation optics so that each image comprising several analysis zones is issued a separate measurement angle on the sample. The resulting image of images from all angles is 'projected' onto a spectral decomposition system (30).