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Heterogeneous material e.g. mica, dielectric rigidity characterization method for electrotechnical industry, involves simulating and/or predicting dielectric rupture tree on target zone based on digital image differentiation from patterns
Heterogeneous material e.g. mica, dielectric rigidity characterization method for electrotechnical industry, involves simulating and/or predicting dielectric rupture tree on target zone based on digital image differentiation from patterns
The method involves acquiring a digital image from a target zone of a sample of a heterogeneous material including two sets of patterns (152, 154). The digital image is processed by differentiating the image from the two sets of patterns. A dielectric rupture tree (156) is simulated and/or predicted on the target zone according to the processing of the image. One set of patterns are representative of one type of component of the heterogeneous material, and the other set of patterns are representative of another type of component of the heterogeneous material structure. Independent claims are also included for the following: (A) a device for characterization of dielectric properties of a heterogeneous material; (B) computer program product.
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