首页> 外国专利> METHOD FOR CALCULATING THERMAL RESISTANCE VALUE OF SEMICONDUCTOR PACKAGE, AND THERMAL RESISTANCE VALUE CALCULATING PROGRAM

METHOD FOR CALCULATING THERMAL RESISTANCE VALUE OF SEMICONDUCTOR PACKAGE, AND THERMAL RESISTANCE VALUE CALCULATING PROGRAM

机译:半导体封装的热阻值的计算方法及热阻值的计算程序

摘要

PROBLEM TO BE SOLVED: To provide a method for calculating the thermal resistance value of a semiconductor package where a systematic error caused by how to select a thermal resistance model for finding a composite thermal resistance value is removed.;SOLUTION: The method for calculating the thermal resistance value of a semiconductor package includes a step S4 that calculates a composite thermal resistance value Rtotal (1) of between a semiconductor chip 1 to an atmosphere 99 obtained on each of a plurality of semiconductor packages and a thermal resistance value θja (2) corresponding to a composite resistance value Rtotal (2) of between the semiconductor chip and the atmosphere obtained on a first semiconductor package that is an object, using the formula showing a correlation with a thermal resistance value θja (1) of between the semiconductor chip and the atmosphere obtained on each of a plurality of the semiconductor packages: θja (1)=f (Rtotal (1)).;COPYRIGHT: (C)2008,JPO&INPIT
机译:要解决的问题:提供一种计算半导体封装的热阻值的方法,该方法消除了由于如何选择热阻模型以找到复合热阻值而引起的系统误差。半导体封装的热阻值包括步骤S4,该步骤计算在半导体芯片1到在多个半导体封装中的每一个上获得的大气99的半导体芯片1与大气电阻之间的复合热阻值Rtotal(1)( 2)对应于半导体芯片与在作为对象的第一半导体封装上获得的大气之间的复合电阻值Rtotal(2),使用表示与之间的热阻值θja(1)的相关性的公式半导体芯片和在多个半导体封装中的每一个上获得的气氛:θja(1)= f(Rtotal(1)).;版权:(C )2008,日本特许厅

著录项

  • 公开/公告号JP2007288012A

    专利类型

  • 公开/公告日2007-11-01

    原文格式PDF

  • 申请/专利权人 NEC ELECTRONICS CORP;

    申请/专利号JP20060115129

  • 发明设计人 ITO MAKOTO;

    申请日2006-04-19

  • 分类号H01L23/34;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:50

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