METHOD OF MEASURING FINE AREA POTENTIAL OF PHOTORECEPTOR, AND DEVICE OF MEASURING FINE AREA POTENTIAL OF PHOTORECEPTOR

摘要

PROBLEM TO BE SOLVED: To provide a method of measuring the fine area potential of a photoreceptor and a device of measuring the fine area potential of a photoreceptor, which are capable of correctly measuring the fine area potential of a photoreceptor with high spatial resolution.;SOLUTION: The method of measuring the fine area potential of the photoreceptor is the measuring method of performing the short pulse exposure of an electrified photoreceptor with spot light having a predetermined beam size, detecting a potential change at this time as signal intensity by an electrode which is close and opposite to the photoreceptor, and applying the signal intensity to calibration curve data produced from the relation of the signal intensity when irradiation with the spot light is performed to a plurality of known electrification potentials, to obtain the unknown electrification potential level of the photoreceptor as an object to be measured. The method of measuring the fine area potential of the photoreceptor is characterized in that the calibration curve data is data obtained by the irradiation with the spot light whenever the position of the surface of the photoreceptor is moved more than once, so that the signal intensity with respect to a predetermined electrification potential satisfies the following condition: a pitch S≥[a beam size in a measurement direction], when the position of the surface of the photoreceptor is defined as a pitch S.;COPYRIGHT: (C)2007,JPO&INPIT