首页> 外国专利> FLAW INSPECTION METHOD OF COLOR LIQUID CRYSTAL PANEL AND FLAW INSPECTION DEVICE THEREFOR

FLAW INSPECTION METHOD OF COLOR LIQUID CRYSTAL PANEL AND FLAW INSPECTION DEVICE THEREFOR

机译:彩色液晶面板的缺陷检测方法及其缺陷检测装置

摘要

PROBLEM TO BE SOLVED: To provide a flaw inspection method of a color liquid crystal panel capable of achieving the compactification of a flaw inspection device and capable of accurately judging a color flaw in a relatively short time, and the flaw inspection device.;SOLUTION: In the flaw inspection method of the color liquid crystal panel, the black display screens acquired by operating the color liquid crystal panel so as to display black screens are photographed with the backlight of the color liquid crystal panel respectively changed over the three primary colors of light by a monochromatic photographing device and the presence of the cell flaw of the color liquid crystal panel is judged from three images acquired by photographing.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种彩色液晶面板的缺陷检查方法,其能够实现缺陷检查装置的紧凑化并且能够在相对短的时间内准确地判断颜色缺陷,并且该缺陷检查装置。在彩色液晶面板的缺陷检查方法中,通过使彩色液晶面板的背光分别在三种原色上变化,来拍摄通过操作彩色液晶面板以显示黑色画面而获得的黑色显示画面。通过单色摄影装置,并通过摄影获得的三幅图像判断彩色液晶面板的单元缺陷的存在。;版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007192613A

    专利类型

  • 公开/公告日2007-08-02

    原文格式PDF

  • 申请/专利权人 MICRONICS JAPAN CO LTD;

    申请/专利号JP20060009731

  • 发明设计人 MIZUNO KUNIHIRO;

    申请日2006-01-18

  • 分类号G01N21/958;G02F1/13;G02F1/1335;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:07

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