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X-RAY BEAM PROCESSOR, X-RAY DETECTING SYSTEM AND X-RAY ANALYZER

机译:X射线束处理器,X射线检测系统和X射线分析仪

摘要

PROBLEM TO BE SOLVED: To easily replace three light detecting elements, that is, a double slit analyzer, a parallel slit analyzer and a crystal analyzer by improving the attaching method of the crystal analyzer.;SOLUTION: An analyzer 4 has a first slit 12a, a device 17 for adjusting the width of the X-ray passing part B of the first slit 12a, a second slit 12b, a device 17 for adjusting the width of the X-ray passing part B of the second slit 12b, the analyzer support device 13 provided between the first and second slits 12a and 12b and replacing the parallel slit analyzer 18 and the crystal analyzer 19 one by one to support one of them in a fixed state and a slit position moving device 9 for moving the second slit 12b in parallel. The parallel moving direction of the second slit 12b by the slit position moving device 9 is a direction for displacing the X-ray passing part B of the slit 12b in the advance direction of X rays diffracted by the crystal analyzer 19 when the crystal analyzer 19 is supported by the analyzer support device 13.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:通过改进晶体分析仪的安装方法,可以容易地更换三个狭缝检测器,即双缝隙分析仪,平行缝隙分析仪和晶体分析仪;解决方案:分析仪4具有第一缝隙12a ,用于调节第一狭缝12a的X射线通过部分B的宽度的装置17,第二狭缝12b,用于调节第二狭缝12b的X射线通过部分B的宽度的装置17,分析仪支撑装置13设置在第一缝隙12a和第二缝隙12b之间,并以平行的状态来对平行缝隙分析仪18和晶体分析仪19进行支撑以固定其中之一,并且缝隙位置移动装置9用于使第二缝隙12b移动。在平行下。狭缝位置移动装置9使第二狭缝12b的平行移动方向是当晶体分析仪19在由晶体分析仪19衍射的X射线的行进方向上使狭缝12b的X射线通过部分B移动的方向。由分析仪支持设备13支持。版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007010486A

    专利类型

  • 公开/公告日2007-01-18

    原文格式PDF

  • 申请/专利权人 RIGAKU CORP;

    申请/专利号JP20050191635

  • 申请日2005-06-30

  • 分类号G01N23/207;G21K1/02;G21K1/06;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:09

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