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DOUBLE BEAM SPECTROPHOTOMETER

机译:双光束分光光度计

摘要

PROBLEM TO BE SOLVED: To provide a double beam spectrophotometer capable of measuring large-scale samples in a horizontally-installed situation.;SOLUTION: The sample-side light flux S is incident in a nearly vertical direction to the undersurface of sample 21, while the light transmitted upward is inflected with a reflecting mirror M to send to an integrating sphere 24 equipped with a detector. The control-side light flux R incident in parallel to the sample-side light flux S is inflected with reflecting mirrors M2 to M4 so as to bypass the sample 21 to be introduced to the integrating sphere 24. The measuring position is, therefore, freely changeable by shifting the sample position, without necessity to prepare holders fitted with magnitude and geometry of the sample 21. Moreover, when the conventional standard sample room 11 is utilized, by inserting adjustable reflecting mirrors 22 and 23 into a light path, the light flux may be obtained to propagate parallelly over horizontal plane by the use of the reflecting mirrors M5 to M7.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种双光束分光光度计,能够在水平安装的情况下测量大型样品。解决方案:样品侧光束S几乎以垂直方向入射到样品21的下表面,而向上透射的光被反射镜M偏转,以传输到装有检测器的积分球24。平行于样品侧光束S入射的控制侧光束R被反射镜M2至M4偏转,从而绕过样品21而被引入积分球24。因此,测量位置是自由的。通过移动样品的位置可以改变样品的位置,而不必准备适合样品21的大小和几何形状的支架。此外,当使用常规的标准样品室11时,通过将可调节的反射镜22和23插入光路中,光束可以通过使用反射镜M5至M7在水平面上平行传播。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007024906A

    专利类型

  • 公开/公告日2007-02-01

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20060250356

  • 发明设计人 SATO TATSUMI;

    申请日2006-09-15

  • 分类号G01N21/27;G01J3/42;

  • 国家 JP

  • 入库时间 2022-08-21 21:11:37

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