DETERIORATION DIAGNOSING METHOD OF NI-BASED HARD METAL BY X-RAY DIFFRACTION METHOD AND FUTURE LIFETIME EVALUATION METHOD

摘要

PPROBLEM TO BE SOLVED: To provide a creep damage diagnosing or future lifetime estimating method especially for an Ni-based hard metal capable of grasping a state even in a region large in creep damage and capable of accurately grasping the whole damage tendency, and the creep damage diagnosing or future lifetime estimating apparatus. PSOLUTION: The creep damage diagnosing or future lifetime estimating apparatus is constituted of a revolving sample stand 2, an X-ray irradiator 1 for emitting monochromatic X rays, an X-ray sensor 3 for measuring the intensity of X rays of a diffraction spot, a sensor position adjustment device 4 for adjusting their arrangement, a data processor 5 for inputting the output of the X-ray sensor to specify the shape of a diffraction peak, a memory device 6 for storing the shape of the diffraction peak and the function of a creep life consumption rate and an arithmetic device 7 for estimating the creep life consumption rate and the future lifetime on the basis of the shape of the diffraction peak using the function to exhibit them. After the X-ray sensor 3 aims at a predetermined diffraction spot, the sample stand 2 is relatively revolved with respect to the X-ray irradiator to measure the shape of the target diffraction peak. PCOPYRIGHT: (C)2007,JPO&INPIT