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LIGHT RESISTANCE TESTING MACHINE AND METHOD

机译:耐光测试机及方法

摘要

PROBLEM TO BE SOLVED: To provide a light resistance testing machine capable of achieving higher life predicting accuracy by setting the test environment to be close to an actual using environment.;SOLUTION: The light resistance testing machine 300 continuously collects test light L and illuminates a sample 100 of an optical element used for an optical device with test light L, and promotes and evaluates the light resistance of the sample 100. The light resistance testing machine comprises a light source 310 having a luminescence wavelength characteristic equivalent to that of the light source in actual use of the optical device, a light shielding shutter 320 for adjusting light quantity of the test light L radiated to the sample 100, an integrator optical system 350 for uniforming the illuminance distribution of the test light L, and a condenser lens 370 for collecting the test light L and illuminating the light receiving face of the sample 100 with it.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种能够通过将测试环境设置为接近实际使用环境来实现更高的寿命预测精度的耐光测试机。解决方案:耐光测试机300连续收集测试光L并照亮光源。用于具有测试光L的光学器件的光学元件的样品100,并促进和评估样品100的耐光性。耐光性测试机包括具有与该光源相同的发光波长特性的光源310在光学装置的实际使用中,用于调节照射到样品100的测试光L的光量的遮光闸门320,用于使测试光L的照度分布均匀的积分光学系统350和用于使测试光L的照度分布均匀的聚光透镜370。收集测试光L并用其照亮样品100的光接收面。版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006329910A

    专利类型

  • 公开/公告日2006-12-07

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20050156710

  • 发明设计人 IKEBE TOMO;

    申请日2005-05-30

  • 分类号G01N17/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:09:18

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