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The process which gap measuring method, the gap measurement equipment, form measuring method, irradiates light to the component which possesses the production

机译:间隙测量方法,间隙测量设备,形状测量方法将光照射到具有生产能力的组件上的过程

摘要

A gap measuring method characterized by comprising the steps of: applying a plurality of color lights to a member provided with a gap, to produce color interference fringes; obtaining respective intensities of the color lights in the images of the interference fringes taken by a color camera, at each of predetermined positions of each image, so as to compute and actual ratio among the obtained intensities of the color lights for each of the predetermined positions; and obtaining gap values of a plurality of points of the gap provided in the member, based on said actual ratio and theoretical ratios each of which is computed based on intensities of said color lights in an image corresponding to each of preliminarily set gap values.
机译:一种间隙测量方法,其特征在于,包括以下步骤:将多个彩色光施加到具有间隙的部件上,以产生彩色干涉条纹;在每个图像的每个预定位置处,获取由彩色相机拍摄的干涉条纹图像中的各个颜色光的强度,从而针对每个预定位置计算所获得的颜色光强度与实际比例;基于所述实际比率和理论比率,获得所述构件中设置的间隙的多个点的间隙值,所述理论比率和理论比率基于与每个预先设定的间隙值相对应的图像中的所述彩色光的强度来计算。

著录项

  • 公开/公告号JP3918499B2

    专利类型

  • 公开/公告日2007-05-23

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20010323732

  • 发明设计人 野田 正明;

    申请日2001-10-22

  • 分类号G01B11/14;G01B11/24;

  • 国家 JP

  • 入库时间 2022-08-21 21:08:54

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