首页> 外国专利> Strain measurement system and multi-point measurement method strain

Strain measurement system and multi-point measurement method strain

机译:应变测量系统和应变的多点测量方法

摘要

PROBLEM TO BE SOLVED: To provide a strain measuring method and a multipoint measuring system for preventing measurement values from being affected depending on resistance of lead wires connected with a set of two strain gages to be used in strain measuring.;SOLUTION: In this system, two series-connected strain gages with each gage factor of K1, K2 are attached to the area of an object where fraction a of its strain rate serves as known, electric current is applied to series circuits of these two strain gages through lead wires 2, 7. At initial state of strain metric and in strain measuring, voltage generated from each strain gage is extracted through lead wires 3-6 to obtain a value ε represented by the following formula as a strain measurement value, based on the above extracted voltage, with resistance value and its variation of the two strain gages made unknown:ε=(Cε-C0)/(K1×C0-a×K2×Cε)(where: Cε= resistance ratio of both strain gages in strain measuring; and C0= resistance ratio of both strain gages at initial state).;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种应变测量方法和多点测量系统,以防止测量值受到与用于应变测量的一组两个应变计相连的导线的电阻的影响。 ,将两个应变系数分别为K 1 ,K 2 的串联应变计连接到对象的应变率分数a起作用的区域,电流通过导线2、7施加到这两个应变计的串联电路。在应变测量的初始状态和在应变测量中,通过导线3-6提取从每个应变计产生的电压以获得值ε。根据上述提取的电压,用以下公式将其表示为应变测量值,并且两个应变计的电阻值及其变化情况未知:&epsi ==(C &epsi; -C 0 )/(K 1 &times; C 0 -a&times; K 2 &times; C &epsi; < / Sub>)(其中:C &epsi; =应变测量中两个应变计的电阻比; C 0 =初始状态下两个应变计的电阻比)。 ;版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP3848661B2

    专利类型

  • 公开/公告日2006-11-22

    原文格式PDF

  • 申请/专利权人 株式会社東京測器研究所;

    申请/专利号JP20040157870

  • 发明设计人 小澤 卓郎;

    申请日2004-05-27

  • 分类号G01B7/16;

  • 国家 JP

  • 入库时间 2022-08-21 21:07:38

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号