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Probe head with vertical probes, method for manufacturing the probe head and probe card using the probe head

机译:具有垂直探头的探头,该探头的制造方法以及使用该探头的探头卡

摘要

A vertical probe head primarily comprise a substrate, a trace layer, and a plurality of vertical probes where the substrate has a first surface, a second surface, and a plurality of device holes penetrating through the first surface and the second surface. The trace layer is formed on the first surface. Each vertical probe has a bonding end and a probing end where the bonding ends are inserted into the device holes of the substrate and are electrically connected to the trace layer and the probing ends are protruded away from the second surface of the substrate. Resins are filled into the device holes to firmly fix the vertical probes so that the vertical probes will not easily be bent nor damaged.
机译:垂直探针头主要包括基底,迹线层和多个垂直探针,其中基底具有第一表面,第二表面以及穿透第一表面和第二表面的多个器件孔。迹线层形成在第一表面上。每个垂直探针具有结合端和探测端,其中结合端插入到基板的器件孔中并且电连接到迹线层,并且探测端远离基底的第二表面突出。将树脂填充到设备孔中,以牢固地固定垂直探针,以使垂直探针不易弯曲或损坏。

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