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Mass spectrometric based method for sample identification

机译:基于质谱的样品鉴定方法

摘要

There is provided a mass spectrometric based method for sample identification, including the steps of introducing sample compounds into a vacuum chamber of a mass spectrometer in a seeded supersonic molecular beam, ionizing with electrons the sample compounds, being vibrationally cold molecules, in the supersonic molecular beam during their flight through an electron ionization ion source, mass analyzing the ionized sample compounds with a mass analyzer of a mass spectrometer to obtain a mass spectrum of at least one compound in the sample, identifying the molecular ion group of isotopomers in the mass spectrum, generating various molecular elemental formulas from the identified molecular ion and a pre-allocated list of elements, reducing the number of the molecular elemental formulas by the incorporation of chemical valence considerations and constraints, calculating isotope abundances for the generated elemental formulas, comparing the calculated isotope abundances with the experimentally obtained mass spectral isotope abundance, and listing the generated elemental formulas according to their degree of matching to the experimentally obtained mass spectral isotope abundance.
机译:提供了一种用于样品鉴定的基于质谱的方法,该方法包括以下步骤:将样品化合物引入到种子超音分子束中的质谱仪的真空室中,用电子电离超音分子中作为振动冷分子的样品化合物。在通过电子电离离子源的过程中,用质谱仪的质量分析仪对电离的样品化合物进行质量分析,以获得样品中至少一种化合物的质谱,从而确定质谱图中的异位异构体的分子离子基团,从识别出的分子离子和预先分配的元素列表中生成各种分子元素式,通过结合化学价因素和约束条件来减少分子元素式的数量,为生成的元素式计算同位素丰度,比较计算得出的同位素丰度与实验统计获得的质谱同位素丰度,并根据它们与实验获得的质谱同位素丰度的匹配程度列出生成的元素式。

著录项

  • 公开/公告号US2006284068A1

    专利类型

  • 公开/公告日2006-12-21

    原文格式PDF

  • 申请/专利权人 AVIV AMIRAV;TAL ALON;

    申请/专利号US20050303645

  • 发明设计人 AVIV AMIRAV;TAL ALON;

    申请日2005-12-16

  • 分类号B01D59/44;

  • 国家 US

  • 入库时间 2022-08-21 21:04:41

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