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Method and apparatus for simultaneously measuring displacement and angular variations

机译:同时测量位移和角度变化的方法和装置

摘要

Disclosed herein is a method and apparatus for simultaneously measuring a displacement and angular variations. The method and apparatus of the present invention allows light radiated from a single light source to be placed along a light axis so as to simultaneously measure a distance (displacement) and angular variations that are different physical quantities, so that the displacement and angular variations of the measuring device of a precision measuring apparatus or machining device of a machine tool moved by a stage can be simultaneously measured without an Abbe error.
机译:本文公开了一种用于同时测量位移和角度变化的方法和设备。本发明的方法和设备允许从单个光源辐射的光沿着光轴放置,从而同时测量不同物理量的距离(位移)和角度变化,从而使光轴的位移和角度变化可以同时测量精密测量设备的测量设备或通过平台移动的机床的加工设备,而不会产生阿贝误差。

著录项

  • 公开/公告号US7268886B2

    专利类型

  • 公开/公告日2007-09-11

    原文格式PDF

  • 申请/专利权人 JAE WAN KIM;TAE BONG EOM;

    申请/专利号US20040874352

  • 发明设计人 JAE WAN KIM;TAE BONG EOM;

    申请日2004-06-24

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-21 21:03:30

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