首页>
外国专利>
Method and/or apparatus for performing static timing analysis on a chip in scan mode with multiple scan clocks
Method and/or apparatus for performing static timing analysis on a chip in scan mode with multiple scan clocks
展开▼
机译:在具有多个扫描时钟的扫描模式下在芯片上执行静态时序分析的方法和/或装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
An apparatus comprising a circuit configured to be tested and a plurality of test blocks within the circuit. Each of the test blocks generally comprises (i) a plurality of sequential elements and (ii) a plurality of logic elements. Each of the test blocks are configured to operate (a) in a first mode comprising a shift mode and (b) a second mode comprising a capture mode. The shift mode generally operates with multiple scan clocks that are clocked simultaneously. The capture mode generally operates with multiple scan clocks, but only one of which is toggled at a time.
展开▼