首页>
外国专利>
Event based test method for debugging timing related failures in integrated circuits
Event based test method for debugging timing related failures in integrated circuits
展开▼
机译:基于事件的测试方法,用于调试集成电路中与时序相关的故障
展开▼
页面导航
摘要
著录项
相似文献
摘要
A test method for debugging failures of an IC device with use of an event based semiconductor test system is capable of distinguishing a timing related failure from other failures. The test method includes the steps of: applying a test signal to a DUT and evaluating a response output of the DUT, detecting a failure in the response output, identifying a reference clock signal related to the failure, identifying a portion of the reference clock signal that is directly related to the failure, and incrementally changing a timing of events for the identified portion of the reference clock signal to detect change in the response output from the DUT.
展开▼