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Method for measuring capacitance and equivalent parallel resistance
Method for measuring capacitance and equivalent parallel resistance
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机译:测量电容和等效并联电阻的方法
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摘要
CX is measured in the presence of RP by charging CX with a constant current IC for a period time and taking four (time, voltage) pairs: (tA,VA), (tB,VB), (tC,VC) and (tD,VD). The first pair are sufficiently close together that the short straight line segment connecting (tA, VA) and (tB, VB) is not significantly different from the corresponding segment of a true graph of the capacitor's actual charging. A similar requirement is imposed on the time interval between tC and tD. The time interval tAtB need not be the same as tCtD. The interval tBtC should be long enough that if there is significant RP present then there is at least a discernable difference between the true graph and a straight line between the first pair and the second. CX and RP are computed as a function of the four pairs and IC, and CX may then be diminished by a previously measured value for a stray capacitance present in the absence of CX.
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机译:C X Sub>是在存在R P Sub>的情况下通过用恒定电流I C Sub>对C X Sub>充电周期时间并取四对(时间,电压):(t A Sub>,V A Sub>),(t B Sub>,V B Sub>),(t C Sub>,V C Sub>)和(t D Sub>,V D Sub>)。第一对足够靠近,使得连接(t A Sub>,V A Sub>)和(t B Sub>,V B Sub>)与电容器实际充电的真实曲线图的对应段没有显着差异。对t C Sub>和t D Sub>之间的时间间隔也提出了类似的要求。时间间隔t A Sub> t B Sub>不需要与t C Sub> t D Sub>相同。间隔t B Sub> t C Sub>应该足够长,以使如果存在显着的R P Sub>,则真实值之间至少存在可辨别的差异。图和第一对与第二对之间的直线。 C X Sub>和R P Sub>是四对和I C Sub>的函数,C X Sub>可以然后减去先前在没有C X Sub>时存在的杂散电容的测量值。
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