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Digital signal processing for real time classification of failure bitmaps in integrated circuit technology development
Digital signal processing for real time classification of failure bitmaps in integrated circuit technology development
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机译:集成电路技术开发中用于故障位图实时分类的数字信号处理
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摘要
A system and method for processing tester information is provided having a system-under-test. A pattern is written to the system-under-test, and a pattern is read therefrom. The pattern written is then compared to the pattern read from the system-under-test. The signal from the comparison is processed, and the signal from the signal processing is then analyzed.
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