Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patterns

摘要

An apparatus for selecting test patterns in accordance with an embodiment of the present invention has a first test pattern selecting module configured to define selected test patterns and unselected test patterns, a fault simulation module configured to simulate whether test patterns detect faults, a weighting module configured to add a weight to each of the first undetected faults, a fault sampling module configured to extract second undetected faults from the first undetected faults to which the added weights are given, and a second test pattern selecting module configured to extract additionally selected test patterns based on the added weight.