The method of quantification of alumu00ecnio in su00eclica scattered X rays combined with chemometrics

摘要

The "method of quantification of alumu00ecnio in su00eclica scattered X rays combined with chemometrics.Covers a method of quantification of aluminium in silica matrices, using conventional equipment EDXRF, whereas, in addition to the emission of X-rays characteristic of the element A1.Also the peaks of scattering of X-ray source, and this method has advantages that not be destructive.It requires minimal or no sample preparation; submit simplicity and rapidity of analysis, with low cost, mainly operational; present high efficiency in obtaining results.Do not generate waste, and can be used as a routine method.