首页> 外国专利> Device for implantation of u00econs in a piece of alloy of alumu00ecnio and treatment process of an alloy of alumu00ecnio

Device for implantation of u00econs in a piece of alloy of alumu00ecnio and treatment process of an alloy of alumu00ecnio

机译:在一块明矾合金中植入明矾的装置和明矾合金的处理工艺

摘要

Device for implantation of u00econs in a piece of alloy of alumu00ecnio and treatment process of an alloy of alumu00ecnio the invention refers to a device for implatau00e7u00e3o of ions in a piece of aluminium alloy (5) which includes a source of u00a2ions (6) which supplies ions accelerated by a The extraction voltage and first means of adjustment (7 - 11) of an initial beam (F1 ') issued by the font ions(6) in a beam of implatau00e7u00e3o (F1). The source (6) is an electronic cyclotron resonance source that produces the initial beam (F1 ') of multi energy ion are implanted in the piece (5) at a temperature below 120 198.The implatau00e7u00e3o of multi energy ion beam implatau00e7u00e3o (F1) governed by means of said adjustment means (7 - 11) is carried out simultaneously to a depth controlled by tension of the extraction of the source.
机译:本发明涉及一种用于在一块铝合金中植入离子的装置和一种用于处理铝合金的工艺的装置,本发明涉及一种用于在一块铝合金中离子植入的装置(5),该装置包括 u00a2ions离子源(6),该离子源提供被i加速的离子。提取电压和对由离子束(6)发出的初始离子束(F1')的初始束缚(F1')的第一调节方式(7-11) u00e3o(F1)。源(6)是一个电子回旋共振源,它会在低于120 <198的温度下将多能量离子的初始束(F1')注入到部件(5)中。借助于所述调节装置(7-11)控制的光束施加(F1)同时进行到由源的提取的张力控制的深度。

著录项

  • 公开/公告号BRPI0507447A

    专利类型

  • 公开/公告日2007-07-10

    原文格式PDF

  • 申请/专利权人 SOCIETE QUERTECH INGENIERIE;R);

    申请/专利号BR2005PI07447

  • 发明设计人 FREDDERIC GUERNALEC;DENIS BUSARDO;

    申请日2005-02-02

  • 分类号C23C8/36;C23C14/48;

  • 国家 BR

  • 入库时间 2022-08-21 20:59:21

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