the invention relates to the analytical u043fu0440u0438u0431u043eu0440u043eu0441u0442u0440u043eu0435u043du0438u044e and can be used to develop a model u0433u0440u0430u0434u0443u0438u0440u043eu0432u043eu0447u043du044bu043a instrumentationto determine the one or more secondary properties of an unknown sample on the basis of the measurement of the primary properties of the sample.method includes the selection of u0433u0440u0430u0434u0443u0438u0440u043eu0432u043eu0447u043du043eu0433u043e set of samples with known secondary propertiescertain u0440u0435u0444u0435u0440u0435u043du0442u043du044bu043cu0438 methods; measurement on site is the primary properties of each of these samples, the conversion of the measurement results to the mindthe u0433u0440u0430u0434u0443u0438u0440u0443u0435u043cu043eu043cu0443 device; a u0433u0440u0430u0434u0443u0438u0440u043eu0432u043eu0447u043du043eu0439 modelto determine the secondary properties of an unknown sample for the measurement of the primary characteristics of this sample of u0433u0440u0430u0434u0443u0438u0440u0443u0435u043cu043eu043c device.feature of the method is that the mathematical relationship of the u0433u0440u0430u0434u0443u0438u0440u043eu0432u043eu043a are collecting the set of samples to carry u0433u0440u0430u0434u0443u0438u0440u043eu0432u043eu043a,the primary properties of each sample are measured not only on the supporting device, and u0433u0440u0430u0434u0443u0438u0440u0443u0435u043cu043eu043c.by comparing the results of the multivariate model, carry out the choice of the independent u0433u0440u0430u0434u0438u0440u043eu0432u043eu0447u043du043eu0439 using procedures to verify its accuracy.this takes account of nonlinear difference u0433u0440u0430u0434u0443u0438u0440u0443u0435u043cu043eu0433u043e technical parameters and reference devices, as well as the operating conditions.
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