DEVICE FOR MEASURING PARAMETERS OF DIELECTRIC MATERIALS AT MICROWAVE FREQUENCIES

摘要

The proposed device for measuring parameters of dielectric materials at microwave frequencies contains a waveguide section and a cylindrical slotted resonator connected in series to the waveguide. The longitudinal axis of the resonator is arranged in parallel to the longitudinal axis of the waveguide. The thickness of the waveguide wall within the slot area is minimal. The resonator is installed in the spatial area that is limited by the dihedral angle formed by the wide and narrow walls of the waveguide. The material sample is placed close to the end surface of the resonator, symmetrically relative to the resonator slot. The proposed device is distinctive by its enhanced sensitivity.