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APPARATUS FOR THE ELECTROMAGNETIC SPECTRUM OR OPTICAL ANALYSIS, IN PARTICULAR PHOTOMETRIC, SPECTROPHOTOMETRIC OR IMAGE ANALYSIS
APPARATUS FOR THE ELECTROMAGNETIC SPECTRUM OR OPTICAL ANALYSIS, IN PARTICULAR PHOTOMETRIC, SPECTROPHOTOMETRIC OR IMAGE ANALYSIS
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机译:用于电磁光谱或光学分析的装置,特别是光度法,分光光度法或图像分析法
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摘要
An apparatus for the electromagnetic spectrum or optical analysis of amaterial to be analyzed that is located in a product space, such as acontainer or tube, in particular for the photometric, spectrophotometric orimage analysis of powder, bulk material, granules and the like, is providedwith a measuring probe which is arranged in a housing and is provided with atleast one radiation or light measuring element, a measuring window, which isarranged in the path of rays in a wall of the housing, and with at least onedetection element for the analysis. The measuring probe is formed and guideddisplaceably in the axial direction in such a way that at least part of thehousing in which the measuring window is located enters through an openinginto the product space in which the material to be analyzed is located, forthe analysis. The at least one measuring window is arranged in at least onesubregion of the circumferential wall of the housing. A sealing cap is locatedbetween a front end face of the housing and the measuring window arranged inthe circumferential wall, which sealing cap is at least partially still in theregion of the opening (5) in the product space (3), and consequently coversthe opening (5), in a retracted position of the measuring probe in which themeasuring window is outside the product space.
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