首页> 外国专利> METHOD AND SYSTEM FOR DETERMINING THE SPREADING PATH OF AT LEAST ONE CRACK FROM A BREAK SURFACE OR FROM A NUMBER OF BREAK SURFACES CREATED BY THIS/THESE CRACK(S)

METHOD AND SYSTEM FOR DETERMINING THE SPREADING PATH OF AT LEAST ONE CRACK FROM A BREAK SURFACE OR FROM A NUMBER OF BREAK SURFACES CREATED BY THIS/THESE CRACK(S)

机译:确定一个或多个断裂面至少一个裂纹扩展路径的方法和系统

摘要

The invention relates to a method and system for determining, in a solid structure having been broken along at least one break surface, the spreading path of at least one crack at the beginning thereof or each break surface. The inventive method comprises: a) a step for acquiring topographical data of the or each surface, either in one case (i) by extracting height profiles along a number of directions, or in another case (ii) by acquiring a map of heights, and with a resolution for which said structure is heterogeneous and rough, characterized in that it comprises, starting with step a): an analysis of statistical properties of roughness of the or each surface that gives evidence of an anisotropy of these properties along a number of directions for deducing from this anisotropy at least one direction of spreading X of the or each crack that defines all or a portion of said path.
机译:本发明涉及一种用于在沿着至少一个断裂面断裂的固体结构中确定至少一个裂纹在其开始处或每个断裂面的扩展路径的方法和系统。本发明的方法包括:a)在一种情况下(i)通过沿多个方向提取高度轮廓,或者在另一种情况下(ii)通过获取高度图来获取该表面或每个表面的地形数据的步骤,并且具有所述结构是异质且粗糙的分辨率,其特征在于,它包括从步骤a)开始:分析该表面或每个表面的粗糙度的统计特性,以证明这些特性沿多个方向的各向异性。从该各向异性推导的方向,其限定了所述路径的全部或一部分,所述裂纹或每个裂纹的扩展X的至少一个方向。

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