METHOD FOR MEASURING STATE OF FINE PARTICLES BY DIELECTRIC MIGRATION

摘要

This invention provides a method for measuring the state of fine particles, comprising the steps of: introducing a fine particle-containing sample into a dielectric migration liquid and measuring the position Ro of the fine particles; generating a heterogeneous electric field in the fine particles in the dielectric migration liquid and measuring the position Rt of the fine particles after t sec; calculating dielectric migration mobility from the positions Ro and Rt of the fine particles; and correlating the above state with the calculated dielectric migration mobility. Here the term “state” refers to at least one of the structure of a surface functional group, the specificity of the surface, potential of the surface, the size, the shape, the activity, the internal ion level distribution, the internal ion component, the internal composition, and the internal structure. The method can simultaneously measure the state of fine particles such as surface properties and internal structure of the fine particles, for example, the activity and life and death of cells.