首页> 外国专利> DIELECTRIC SPECTRUM MEASURING SYSTEM USING CO-AXIAL TYPE LF/RF DIELECTRIC SENSOR WITH FIXTURE

DIELECTRIC SPECTRUM MEASURING SYSTEM USING CO-AXIAL TYPE LF/RF DIELECTRIC SENSOR WITH FIXTURE

机译:同轴型/射频介电传感器的介电谱测量系统

摘要

PURPOSE: A dielectric spectrum measuring system by dielectric sensor common coaxial type LF/RF with sensor fixture is provided to secure electric/structural stability by having a coaxial dielectric sensor and a sensor fixture. CONSTITUTION: An high temperature control system(2) comprises a cylindrical hot-wire cap, a thermo-couple and a temperature controller to control a coaxial type sensor body(1). The cylindrical hot-wire cap is wound around a hot-wire which covers the coaxial type sensor body(1). A low temperature control system(6) covers the cylindrical hot-wire cap. The low temperature control system(6) includes a heat conduction inner wall and an insulation outer wall. The low temperature control system controls temperature by injecting liquid nitrogen between the inner wall and the outer wall. An impedance measuring instrument(4) is connected at the coaxial type sensor body(1). The impedance measuring instrument(4) measures an impedance of a sample positioned in the cylindrical sensor body(1). An sensor fixture(3) connects the impedance measuring instrument(4) to the cylindrical sensor body(1). A computer(5) controls the high temperature control system(2) and the low temperature control system(6) and analyzes measuring data.
机译:用途:介电谱测量系统由介电传感器普通同轴型LF / RF和传感器夹具提供,以通过具有同轴介电传感器和传感器夹具来确保电气/结构稳定性。组成:高温控制系统(2)包括一个圆柱形热线帽,一个热电偶和一个温度控制器,用于控制同轴型传感器主体(1)。圆柱形的热线帽缠绕在覆盖同轴型传感器主体(1)的热线上。低温控制系统(6)覆盖圆柱形热线帽。低温控制系统(6)包括导热内壁和绝缘外壁。低温控制系统通过在内壁和外壁之间注入液氮来控制温度。阻抗测量仪(4)连接在同轴型传感器主体(1)上。阻抗测量仪器(4)测量位于圆柱形传感器主体(1)中的样品的阻抗。传感器固定装置(3)将阻抗测量仪器(4)连接到圆柱形传感器主体(1)。计算机(5)控制高温控制系统(2)和低温控制系统(6)并分析测量数据。

著录项

  • 公开/公告号KR100645638B1

    专利类型

  • 公开/公告日2006-11-13

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20000054412

  • 发明设计人 김호진;김진철;

    申请日2000-09-16

  • 分类号G01R27/26;G01R29/12;

  • 国家 KR

  • 入库时间 2022-08-21 20:41:28

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