A SINGLE-SCAN BEAM-EMITTANCE MEASURING DEVICE USING A ROTATIONAL SLIT STRUCTURE

摘要

the present invention using a single scan, the rotatable slit beam emitter capacitance meter of such, and more particularly forming a right angle with each of the two surfaces that form the slit are perpendicular to each other in the bent slit plate, the slit plate by a fold line in an axial position so that each slit is alternately on a traveling path of the beam according to a reciprocating rotation 90 Sikkim formed by, and through the one-time scan job on the emission of only one of the slit plate capacitance meter is configured to measure the emitter capacitance of the two-axis component at the same time. ; Using a rotatable slit according to the invention single scanning beam emitter capacitance meter is, perpendicular to the slit plate, which is bent slit is formed in each of the two surfaces, which is a perpendicular to each other; Once transported to the slit in the slit plate or plates attached to the reciprocating rotation of the driving slit; And by each of the collecting beam passes through each slit, a pair of beams, including a collector for outputting a current signal according to the distribution of the beam is characterized in the point that the configuration. ; in accordance with the present invention single scanning beam emitter capacitance meter with a rotatable slit, it is possible to reduce the slit plate provided with only one installation space and working space, if the space is to measure the emitter capacitance of the output beam of a narrow accelerator installation work of the apparatus there is an effect that can easily be.