首页> 外国专利> CHEMICAL MECHANICAL POLISHING METHOD, METHOD OF MANUFACTURING A FERRO-ELECTRIC CAPACITOR USING THE CHEMICAL MECHANICAL POLISHING METHOD AND METHOD OF MANUFACTURING A FERRO-ELECTRIC MEMORY DEVICE USING THE CHEMICAL MECHANICAL POLISHING METHOD

CHEMICAL MECHANICAL POLISHING METHOD, METHOD OF MANUFACTURING A FERRO-ELECTRIC CAPACITOR USING THE CHEMICAL MECHANICAL POLISHING METHOD AND METHOD OF MANUFACTURING A FERRO-ELECTRIC MEMORY DEVICE USING THE CHEMICAL MECHANICAL POLISHING METHOD

机译:化学机械抛光方法,使用化学机械抛光方法制造铁电电容器的方法以及使用化学机械抛光方法制造铁电存储器的方法

摘要

A CMP method and methods for manufacturing a ferroelectric capacitor and a ferroelectric memory device using the same are provided to polish stably a polishing object layer without the damage of a ferroelectric pattern using a slurry containing ceria. A ferroelectric pattern(11) containing a ferroelectric material with Ti and O2 is formed. The ferroelectric pattern is used as a polishing stop pattern. A polish object layer is formed on the ferroelectric pattern. The polishing object layer is performed with a CMP process by using a slurry containing ceria until the ferroelectric pattern is exposed to the outside.
机译:提供一种CMP方法和用于制造铁电电容器的方法以及使用该方法的铁电存储装置,以使用包含二氧化铈的浆料稳定地抛光抛光对象层而不会损害铁电图案。形成包含具有Ti和O 2的铁电材料的铁电图案(11)。铁电图案用作抛光停止图案。在铁电图案上形成抛光对象层。通过使用包含二氧化铈的浆料通过CMP工艺来执行抛光对象层,直到铁电图案暴露于外部。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号