首页> 外国专利> Transparent substrate transmission measuring instrument for vacuum system, has retro-reflector located on one side of plane, where main axis of retro-reflector runs vertically to plane to coincide with normal axis of plane

Transparent substrate transmission measuring instrument for vacuum system, has retro-reflector located on one side of plane, where main axis of retro-reflector runs vertically to plane to coincide with normal axis of plane

机译:用于真空系统的透明基片透射测量仪,其后向反射器位于平面的一侧,后向反射器的主轴线垂直于平面,与平面的法线轴重合

摘要

The instrument has a measuring head with a light emitting unit emitting a beam of light onto a substrate plane, and a light receiver unit recording an incident beam. The head and a retro-reflector are located on the two respective sides of the plane. The retro-reflector is realized as a cube corner prism made of optical glass. The light emission direction of the emitted light makes an angle (7) with a normal axis (6) of the plane, where a main axis of the retro-reflector makes an angle (7) related to the direction. The main axis runs vertically to the plane to coincide with the normal axis.
机译:该仪器具有测量头,该测量头具有将光束发射到基板平面上的发光单元,以及记录入射光束的光接收器单元。头部和后向反射器分别位于平面的两侧。后向反射器被实现为由光学玻璃制成的立方角棱镜。发射光的光发射方向与平面的法线轴(6)成角度(7),其中后向反射器的主轴线与该方向成角度(7)。主轴垂直于平面,与法线重合。

著录项

  • 公开/公告号DE102005025385A1

    专利类型

  • 公开/公告日2006-12-28

    原文格式PDF

  • 申请/专利权人 VON ARDENNE ANLAGENTECHNIK GMBH;

    申请/专利号DE20051025385

  • 发明设计人 PROEHL HOLGER;KRAUSE JOCHEN;

    申请日2005-05-31

  • 分类号G01N21/59;G01B11/06;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:59

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