首页> 外国专利> Strain measuring device for small relative strain, has strain gauge and part under test arranged on axis of symmetry through C-frame, and gap providing overload protection

Strain measuring device for small relative strain, has strain gauge and part under test arranged on axis of symmetry through C-frame, and gap providing overload protection

机译:用于较小相对应变的应变测量装置,具有应变仪和被测部件,通过C形框架布置在对称轴上,间隙提供过载保护

摘要

The measuring device comprises a symmetrical structure with a part under test (1) and strain gauge (8) arranged on the axis of symmetry through the C-frame of the measuring device. The C-frame, threaded spindles (3,5) and measuring heads (4,6) are made of materials having similar linear temperature expansion coefficients. Overload protection (9) is provided in the form of a gap that closes with increasing measurement force.
机译:该测量装置包括对称结构,该对称结构具有被测部件(1)和应变仪(8),该应变仪布置在穿过测量装置C形框架的对称轴上。 C型机架,丝杠(3,5)和测量头(4,6)由具有类似线性温度膨胀系数的材料制成。过载保护装置(9)以间隙形式提供,该间隙随着测量力的增加而关闭。

著录项

  • 公开/公告号DE102005036613A1

    专利类型

  • 公开/公告日2007-04-05

    原文格式PDF

  • 申请/专利权人 FLINTEC GMBH;

    申请/专利号DE20051036613

  • 发明设计人 HERTLING FELIX;

    申请日2005-08-01

  • 分类号G01B7/16;G01B7/12;G01M7/02;G01M3/36;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:49

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