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Test prod for e.g. electrical characteristics measurement, during electrical circuitry testing, has support unit with U-shaped section, where all or part of contact units of support unit overlap on sides facing high frequency wave guides
Test prod for e.g. electrical characteristics measurement, during electrical circuitry testing, has support unit with U-shaped section, where all or part of contact units of support unit overlap on sides facing high frequency wave guides
The prod has a support unit (2) with a conducting path for transmission of high-frequency (HF) signals and/or HF mass potential from a neutral conductor of a coaxial HF wave guide to contact units (4). The unit (2) includes a U-shaped section (21) with a base (211) and two flanks (212). Breadth of the section measured between the two flanks corresponds to an outer diameter of a coaxial HF waveguide. All or a part of the contact units of the support unit overlap on sides facing the coaxial high frequency wave guides.
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