首页> 外国专利> Test prod for e.g. electrical characteristics measurement, during electrical circuitry testing, has support unit with U-shaped section, where all or part of contact units of support unit overlap on sides facing high frequency wave guides

Test prod for e.g. electrical characteristics measurement, during electrical circuitry testing, has support unit with U-shaped section, where all or part of contact units of support unit overlap on sides facing high frequency wave guides

机译:测试产品例如电气特性测量在电路测试期间具有U形截面的支撑单元,支撑单元的全部或部分接触单元在面向高频波导的一侧重叠

摘要

The prod has a support unit (2) with a conducting path for transmission of high-frequency (HF) signals and/or HF mass potential from a neutral conductor of a coaxial HF wave guide to contact units (4). The unit (2) includes a U-shaped section (21) with a base (211) and two flanks (212). Breadth of the section measured between the two flanks corresponds to an outer diameter of a coaxial HF waveguide. All or a part of the contact units of the support unit overlap on sides facing the coaxial high frequency wave guides.
机译:该刺棒具有支撑单元(2),该支撑单元(2)具有用于将高频(HF)信号和/或HF质量电势从同轴HF波导的中性导体传输到接触单元(4)的传导路径。单元(2)包括具有底部(211)和两个侧面(212)的U形部分(21)。在两个侧面之间测量的截面的宽度对应于同轴HF波导的外径。支撑单元的全部或部分接触单元在面向同轴高频波导的侧面上重叠。

著录项

  • 公开/公告号DE102005053146A1

    专利类型

  • 公开/公告日2007-05-10

    原文格式PDF

  • 申请/专利权人 SUSS MICROTEC TEST SYSTEMS GMBH;

    申请/专利号DE20051053146

  • 发明设计人 KANEV STOJAN;SCHOTT STEFFEN;

    申请日2005-11-04

  • 分类号G01R31/28;G01R1/067;H01R11/18;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:37

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