Atom fluorescence spectrometer e.g. spark emission spectrometer, for analyzing metallic samples, has spark generator producing plasmas in area between electrode and sample surface, and radiation source producing fluorescence radiation

摘要

The spectrometer has an auxiliary spark generator (55) producing plasmas in an area between a counter electrode (3) and a sample surface, where a spectrometer optics has an inflow gap, a dispersive unit and a number of sensors. An auxiliary radiation source is arranged for optical radiation of the areas between the electrode and the sample surface, and provided for producing fluorescence radiation. An additional sensor is provided for detecting the fluorescence radiation, where the radiation passes through the optics or the inflow gap with a variable width. An independent claim is also included for a method for analyzing metallic probes by an atom fluorescence spectrometer.