首页> 外国专利> Electrical contacts manufacturing method for e.g. dynamic random access memory cell, involves applying spacer layer on upper side wall region of conductors before arranging contacts, where spacer layer separates conductors from contacts

Electrical contacts manufacturing method for e.g. dynamic random access memory cell, involves applying spacer layer on upper side wall region of conductors before arranging contacts, where spacer layer separates conductors from contacts

机译:电触头的制造方法,例如动态随机存取存储单元,涉及在布置触点之前在导体的上侧壁区域上施加间隔层,其中间隔层将导体与触点分开

摘要

The method involves arranging contacts adjacent to electrical conductors of a silicon substrate and electrically separating the contacts from the conductors. A spacer layer (100) e.g. oxide layer, is coated on a side wall region of the conductors before arranging the contacts. The spacer layer separates the conductors from the contacts. A protection cap made of a dielectric material e.g. silicon nitride, is applied on sides of the conductors. An upper side wall section (200) of the protection cap and the side wall region of the conductors are provided with the spacer layer. An independent claim is also included for an electronic component e.g. dynamic random access memory (DRAM) cell, comprising a field effect transistor.
机译:该方法包括将触点布置成与硅基板的电导体相邻,并将触点与导体电分离。隔离层(100),例如在布置触点之前,将氧化层涂覆在导体的侧壁区域上。间隔层将导体与触点分开。由介电材料制成的保护盖,例如将氮化硅涂覆在导体的侧面。保护帽的上侧壁部分(200)和导体的侧壁区域设置有隔离层。对于电子组件,例如,也包括独立权利要求。动态随机存取存储器(DRAM)单元,包括一个场效应晶体管。

著录项

  • 公开/公告号DE102005063258A1

    专利类型

  • 公开/公告日2007-07-12

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE20051063258

  • 发明设计人 TEGEN STEFAN;

    申请日2005-12-30

  • 分类号H01L21/283;H01L21/768;H01L21/336;H01L27/108;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:35

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