Laminar connection testing method involves setting up testing stamp on magnet, exerting pulling force on testing stamp perpendicularly to contact level, testing and generating test result signal without separating testing stamp from magnet

摘要

The method involves setting up a magnetic or magnetizable testing stamp (07) on a magnet (03). A pulling force is exerted on the testing stamp perpendicularly to the contact level and is increased up to an end-pulling force, which is equal to minimum detention force. A test result signal is tested and generated as a function of end-pulling force without the separation of testing stamp from the magnet. The contact level is mounted between a carrier (02) and the magnet, which applies the predetermined minimum detention force. An independent claim is also included for a device for testing a predetermined minimum detention force of a laminar connection in a contact level between a magnet and a carrier.